Product classification
Discrete Semiconductor ATE
The XI810 high-speed discrete device testing system consists of four measurement units, achieving high-speed parallel testing and multi-station testing through an asynchronous parallel testing architecture. It features real-time waveform acquisition and display capabilities, as well as ultra-fast testing capabilities. It offers various extended testing options to meet diverse customer testing needs at a lower cost.
The XI810HP is a high-speed discrete device testing system developed based on the XI810 system platform upgrade. It supports dual-station parallel testing. It features real-time waveform acquisition and display capabilities, as well as fast testing capabilities. It offers various extended testing options to meet diverse customer testing needs at a lower cost.