XI810 HP
+
  • XI810 HP

Product Introduction

The XI810HP is a high-speed discrete device testing system developed based on the XI810 system platform upgrade. It supports dual-station parallel testing. It features real-time waveform acquisition and display capabilities, as well as fast testing capabilities. It offers various extended testing options to meet diverse customer testing needs at a lower cost.

 

Applications

Diodes, Transistors, MOSFETs, IGBTs, SCRs

 

Features

· Standard configuration 1500V/50A

· True parallel testing with 2 independent test heads

· Supports avalanche testing and capacitor testing extension options

· Supports high voltage and high current extension options

· Scan code to load test programs

· Software plugin functionality

· Designed by a Japanese R&D team, stable and reliable

 

Advantages

1. High-speed discrete device testing technology architecture.

2. Dual-station independent parallel testing capability.

3. High speed, high precision, supports UPH 60K/H high-speed sorting machine.

 

Specifications

Items

Specifications

Test Station

Up to 2 positions (asynchronous)

Test Items

126

High Voltage Module

00.0000V~±1500.00 V

Low Voltage Module

000.00 mV~±40.000 V

High Current Module

0.0000 uA~±50.0000 A

Low Current Module

000.00 pA~±10.00 A

Leakage Current Detector

000.00 pA~±5.00 uA

Measurement Resolution

16-bit

Test Data Format

CSV, STDF, TXT, Xlsx, Custom format

TTL Output Voltage

+5V/+12V

TTL Input Signal

Start, Index

TTL Output Signal

8 groups, Pass/Fail/End/Busy

TTL Classification Signal

BIN1-16

Software Functions

Software Oscilloscope Function

External Configuration

Detection Box, Calibration Box

System Power

3kW

 

Power Device Testing Options

Options

Specifications

HC-200A Option

200A/30V

HV-3KV Option

20mA/3KV

Keywords

XI810 HP

XI810 HP
+
  • XI810 HP

XI810 HP

The XI810HP is a high-speed discrete device testing system developed based on the XI810 system platform upgrade. It supports dual-station parallel testing. It features real-time waveform acquisition and display capabilities, as well as fast testing capabilities. It offers various extended testing options to meet diverse customer testing needs at a lower cost.


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