
Product Introduction
The XI810HP is a high-speed discrete device testing system developed based on the XI810 system platform upgrade. It supports dual-station parallel testing. It features real-time waveform acquisition and display capabilities, as well as fast testing capabilities. It offers various extended testing options to meet diverse customer testing needs at a lower cost.
Applications
Diodes, Transistors, MOSFETs, IGBTs, SCRs
Features
· Standard configuration 1500V/50A
· True parallel testing with 2 independent test heads
· Supports avalanche testing and capacitor testing extension options
· Supports high voltage and high current extension options
· Scan code to load test programs
· Software plugin functionality
· Designed by a Japanese R&D team, stable and reliable
Advantages
1. High-speed discrete device testing technology architecture.
2. Dual-station independent parallel testing capability.
3. High speed, high precision, supports UPH 60K/H high-speed sorting machine.
Specifications
Items |
Specifications |
Test Station |
Up to 2 positions (asynchronous) |
Test Items |
126 |
High Voltage Module |
00.0000V~±1500.00 V |
Low Voltage Module |
000.00 mV~±40.000 V |
High Current Module |
0.0000 uA~±50.0000 A |
Low Current Module |
000.00 pA~±10.00 A |
Leakage Current Detector |
000.00 pA~±5.00 uA |
Measurement Resolution |
16-bit |
Test Data Format |
CSV, STDF, TXT, Xlsx, Custom format |
TTL Output Voltage |
+5V/+12V |
TTL Input Signal |
Start, Index |
TTL Output Signal |
8 groups, Pass/Fail/End/Busy |
TTL Classification Signal |
BIN1-16 |
Software Functions |
Software Oscilloscope Function |
External Configuration |
Detection Box, Calibration Box |
System Power |
3kW |
Power Device Testing Options
Options |
Specifications |
HC-200A Option |
200A/30V |
HV-3KV Option |
20mA/3KV |
Keywords
XI810 HP

XI810 HP
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