Product Introduction
The XI810HP is a high-speed discrete device testing system developed based on the XI810 system platform upgrade. It supports dual-station parallel testing. It features real-time waveform acquisition and display capabilities, as well as fast testing capabilities. It offers various extended testing options to meet diverse customer testing needs at a lower cost.
Applications
Diodes, Transistors, MOSFETs, IGBTs, SCRs
Features
· Standard configuration 1500V/50A
· True parallel testing with 2 independent test heads
· Supports avalanche testing and capacitor testing extension options
· Supports high voltage and high current extension options
· Scan code to load test programs
· Software plugin functionality
· Designed by a Japanese R&D team, stable and reliable
Advantages
1. High-speed discrete device testing technology architecture.
2. Dual-station independent parallel testing capability.
3. High speed, high precision, supports UPH 60K/H high-speed sorting machine.
Specifications
Items | Specifications |
Test Station | Up to 2 positions (asynchronous) |
Test Items | 126 |
High Voltage Module | 00.0000V~±1500.00 V |
Low Voltage Module | 000.00 mV~±40.000 V |
High Current Module | 0.0000 uA~±50.0000 A |
Low Current Module | 000.00 pA~±10.00 A |
Leakage Current Detector | 000.00 pA~±5.00 uA |
Measurement Resolution | 16-bit |
Test Data Format | CSV, STDF, TXT, Xlsx, Custom format |
TTL Output Voltage | +5V/+12V |
TTL Input Signal | Start, Index |
TTL Output Signal | 8 groups, Pass/Fail/End/Busy |
TTL Classification Signal | BIN1-16 |
Software Functions | Software Oscilloscope Function |
External Configuration | Detection Box, Calibration Box |
System Power | 3kW |
Power Device Testing Options
Options | Specifications |
HC-200A Option | 200A/30V |
HV-3KV Option | 20mA/3KV |
Keywords
XI810 HP
XI810 HP
Contact Us
Classification
Su Gong Wang An Bei No. 32011102010656