Product Introduction
The XI810 high-speed discrete device testing system consists of four measurement units, achieving high-speed parallel testing and multi-station testing through an asynchronous parallel testing architecture. It features real-time waveform acquisition and display capabilities and ultra-fast testing capabilities. It offers various extended testing options to meet diverse customer testing needs at a lower cost.
Applications
Diodes, Zener diodes, transistors, MOSFETs, thyristors, IGBTs, voltage regulators, optocouplers
Features
New high-speed asynchronous testing system architecture
Expandable to 4 types of test head configurations, single and parallel testing, can connect up to four sorting machines simultaneously
Optional software and hardware function modules: JFET measurement module, dynamic PAT, leakage current self-adaptive range, external instrument control, etc.
The testing system includes functional components for testing voltage, current, leakage current, and time parameters.
The power supply system includes functions such as power conversion, control protection, and EMC filtering.
Advantages
1. High-speed discrete device testing technology architecture.
2. Four-station independent parallel testing capability.
3. High speed, high precision, supports UPH 65K/H high-speed sorting machines.
4. Supports 8Pin/12Pin discrete device testing.
Specifications
|
Item |
Specifications |
|
Testing Station |
Up to 4 (asynchronous) |
|
HVI Voltage |
000.00 V~800.00 V |
|
HVI Current |
00,000 mA~50,000 mA |
|
LVI Voltage |
00.00 V~40.00 V |
|
LVI Current |
00,000 A~10,000 A |
|
Small Current Detection Range |
0.000 uA~1.000 uA |
|
Output Resolution |
16 bit |
|
Detection Resolution |
18 bit |
|
Number of BINS |
16 BIN |
|
BCD or Binary |
200 BIN |
|
Testing Items |
Up to 254 items |
|
Sorting Items |
Up to 126 items |
Testing Options
|
Options |
Specifications |
|
pA Testing Options |
5pA-5nA, accuracy 1pA |
|
Cj Testing Options |
1.5 MHz, 2Vrms, DC 20V |
Keywords
XI810
XI810
Contact Us
Classification
Contact Us
Nanjing Hongtai Semiconductor Technology Co., Ltd. (Group Headquarters)
Phone Number:+86-25-69067857
Floor 15 and 16, Block A, IC Design Building, No. 99 Jinsui Road, Pukou District, Nanjing City, Jiangsu Province
Shanghai Hongtai Core Semiconductor Technology Co., Ltd. (Shanghai Subsidiary)
Phone Number:+86-21-53082067
Address: Floor 6, Building 3, East District, 2169 Chen Hang Highway, Minhang District, Shanghai
Shenzhen Nuotai Core Equipment Co., Ltd. (Shenzhen Subsidiary)
Phone Number:+86-18123860446
Address: Floor 1 and Floor 4, Building D, Wanfeng Huafeng High-tech Industrial Park, Shajing Street, Bao 'an District, Shenzhen
Azur Test Co., Ltd. (Nippon Child)
Phone Number:+81-49-211-5033
Site: 2-8-15 Kasumigaseki East, Kawagoe-shi, Saitama Plaza S Kasumigaseki 1F
Nanjing Hengtai Core Technology Co., Ltd. (Nanjing Subsidiary)
Phone Number:+86-25-58915619
Address: Floor 17, Block A, IC Design Building, No. 99 Jinsui Road, Pukou District, Nanjing
Su Gong Wang An Bei No. 32011102010656