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Product Introduction:

The MS7600 is a fully floating source architecture testing system developed based on the upgraded MS7000 system platform. It adopts a TWIN structure that supports two STATIONs to operate independently and measure functions, featuring rich user resources, flexibility, scalability, easy upgrades, and maintenance. It is an efficient and low-cost testing system. A single testing device can simultaneously integrate high-speed digital testing, analog, high-voltage sources, high current, mixed signals, and RF testing options. The MS7600 testing system targets chips such as driver chips, power management chips, interface chips, operational amplifiers, and BMS chips, enabling independent multi-SITE parallel testing for two STATIONs, achieving a testing efficiency of over 99.5%. The MS7600 PLUS version can expand more testing resources for additional SITE applications.

Power Management IC

DC-DC, AC-DC Converter Chips

Lithium-ion Battery Charger Chips

BMS Chips

Operational Amplifier Circuits

Operational Amplifiers

Comparators

Audio Amplifiers

Control ICs

Voice ICs

Encoder/Decoder Chips

Mobile Peripheral ICs

LDO, PWM Control ICs

Display Driver ICs

Interface Chips

Consumer Electronics

Motor Driver Chips

FM/AM Radio Chips

Analog Switches

Sensor ICs

Hall ICs

Temperature Sensors

Features

· Up to 13 analog card slots and 4 digital card slots

· Supports parallel testing for 16 sites, with parallel testing efficiency > 99.5%.

· Up to 128 channel V/I sources, 128 channel digital pins

· Fully floating V/I sources

· Maximum voltage, +1500V (stacked single board)

· Maximum current, 10A (pulse)

· V/I sources with Perpin AWG/Digitizer functionality

· 50 MHz digital testing rate

· High-speed serial bus interface

Advantages

1. Self-developed fully floating source system architecture with high testing accuracy.

2. Supports customized development of testing application software.

Specifications

Testing Options		Specifications		MS7600
Mainframe	FLVI	Channels	8CH, floating ground for each group (two channels)	96
		Voltage Range	±40V
		Current Range	±1A (pulse)
	FMVI	Channels	2CH, floating ground for each channel	16
		Voltage Range	±100V/160mA
		Current Range	±10A (pulse) @10V
	FDHV	Channels	2CH, floating ground for each channel	16
		Voltage Range	-500V~+1000V
		Current Range	±16mA
	FTMB	Channels	Up to 8CH, floating ground for each group (two channels)	32
		Voltage Range	-5V~+25V
		Frequency Range	1Hz~40MHz
	FVI8	Channels	8CH, floating ground for each channel	96
		Voltage Range	±10 V
		Current Range	±380mA
	CIFB	CBIT	128 bits; 5V/100mA	128
	CIFB	TTL	8SITE; SOT, EOT, BIN1~BIN8	8
Test Head	DCBH	Channels	32CH	128
		DPIN	-2V~+6V; 50MHz/64M
		PPMU	-2V~+6V/50mA; Active load: 24mA
		DTMU	Per pin: -2V~+6V, 50 MHz
		DOMU Channel	8CH	32
		Voltage Range	-2V~+10V
		Current Range	±512mA

Keywords

MS7600

The MS7600 is a fully floating source architecture testing system developed based on the upgraded MS7000 system platform. It adopts a TWIN structure that supports two STATIONs operating independently and measuring functions, featuring rich user resources. It is characterized by flexibility, scalability, ease of upgrade, and ease of maintenance, making it an efficient and low-cost testing system. A single testing device can simultaneously integrate high-speed digital testing, analog, high-voltage sources, high current, mixed signals, and RF testing options. The MS7600 testing system targets chips such as driver chips, power management chips, interface chips, operational amplifiers, and BMS chips, enabling independent multi-SITE parallel testing for two STATIONs, with a measurement efficiency of over 99.5%. The MS7600 PLUS version can expand more testing resources for additional SITE testing applications.

086-25-69067857

Classification

Numerical Model Integrated Circuit ATE

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