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XI810

The XI810 high-speed discrete device testing system consists of four measurement units, achieving high-speed parallel testing and multi-station testing through an asynchronous parallel testing architecture. It features real-time waveform acquisition and display capabilities, as well as ultra-fast testing capabilities. It offers various extended testing options to meet diverse customer testing needs at a lower cost.

XI810 HP

The XI810HP is a high-speed discrete device testing system developed based on the XI810 system platform upgrade. It supports dual-station parallel testing. It features real-time waveform acquisition and display capabilities, as well as fast testing capabilities. It offers various extended testing options to meet diverse customer testing needs at a lower cost.

OS2000E

The OS2000E is a programmable open/short testing system that includes eight 256-channel test modules, supporting up to 2048 channels and parallel testing at up to eight sites. Each site can customize pin assignments and test conditions for each pin. Testing programs can be developed and debugged online through the computer's USB interface, allowing for downloading, running, and monitoring. After downloading the USB program, the testing machine can operate independently of the computer. The product features an integrated design, modular structure, and self-elevating structure.

MS737 FLEX

MS737FLEX is a ground-source simulation integrated circuit testing system developed by MTS. It features a brand new system architecture and has a wealth of user resources, making it an efficient and cost-effective testing system. The MS737FLEX testing system targets chips such as driver chips, power management chips, interface chips, and operational amplifier chips.

MS7600

The MS7600 is a fully floating source architecture testing system developed based on the upgraded MS7000 system platform. It adopts a TWIN structure that supports two STATIONs operating independently and measuring functions, featuring rich user resources. It is characterized by flexibility, scalability, ease of upgrade, and ease of maintenance, making it an efficient and low-cost testing system. A single testing device can simultaneously integrate high-speed digital testing, analog, high-voltage sources, high current, mixed signals, and RF testing options. The MS7600 testing system targets chips such as driver chips, power management chips, interface chips, operational amplifiers, and BMS chips, enabling independent multi-SITE parallel testing for two STATIONs, with a measurement efficiency of over 99.5%. The MS7600 PLUS version can expand more testing resources for additional SITE testing applications.

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Nanjing Hongtai Semiconductor Technology Co., Ltd. (Group Headquarters)

Phone Number:+86-25-69067857

Floor 15 and 16, Block A, IC Design Building, No. 99 Jinsui Road, Pukou District, Nanjing City, Jiangsu Province

Shanghai Hongtai Core Semiconductor Technology Co., Ltd. (Shanghai Subsidiary)

Phone Number:+86-21-53082067

Address: Floor 6, Building 3, East District, 2169 Chen Hang Highway, Minhang District, Shanghai

Shenzhen Nuotai Core Equipment Co., Ltd. (Shenzhen Subsidiary)

Phone Number:+86-18123860446

Address: Floor 1 and Floor 4, Building D, Wanfeng Huafeng High-tech Industrial Park, Shajing Street, Bao 'an District, Shenzhen

Azur Test Co., Ltd. (Nippon Child)

Phone Number:+81-49-211-5033

Site: 2-8-15 Kasumigaseki East, Kawagoe-shi, Saitama Plaza S Kasumigaseki 1F

Nanjing Hengtai Core Technology Co., Ltd. (Nanjing Subsidiary)

Phone Number:+86-25-58915619

Address: Floor 17, Block A, IC Design Building, No. 99 Jinsui Road, Pukou District, Nanjing

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