Product Introduction
In an era where the demand for intelligent and new energy devices is growing, iterative processes bring about the need for more cost-effective, stable, and reliable ATE to achieve more efficient mass production of complex SoC devices with higher density.
Macrotest's latest generation SoC testing system MS8000 adopts an integrated test head architecture, high-speed system bus, and system-level boards, providing higher resource density and ultra-high parallel testing capabilities. The MS8000 allows for various high-end functions at a lower cost to adapt to new SoC testing trends.
The MS8000 will become one of the most competitive products in the local and global SoC testing market by providing optimized cost-performance solutions.
Applications
Microprocessors, FPGA, memory (EEPROM, SRAM, Flash), MEMS (ToF), PMIC, Internet of Things (IoT), audio and mixed-signal devices, LED drivers
Features
Up to 200MHz, 400Mbps data rate
Up to 1536 digital I/O channels
Up to 768 sites for parallel testing
8M acquisition memory per pin
System-level boards:
*DPO16 option: integrates 16 VI sources
*CTO and DSCU options: for mixed-signal testing
*Memory test unit and simplified memory vector generator (SMPG)
*SCAN option: maximum 4G depth/chain
*Maximum 512M vector storage depth
*Independent test processor for each board
Optional multi-core test processor
True parallel trim and match
PMU, dynamic load, TMU, free-running clock, and protocol-level testing for each pin
Memory test options for embedded memory
Multiple VI options: 60V high voltage VI and high-density VI
Visual ATE software for development, maintenance, and production
Data analysis tools, digital/analog waveform tools, vector tools, debugging tools, etc.
Vector code compatible with J7XX
STDF tools
Vector programming (POP)
Vector/test program converter
Note: Lines marked with (*) are related to digital channel board options.
Advantages
Independently developed by a local team.
High performance comparable to international mainstream platforms.
Competitive architecture (high-speed bus/system-level boards/integrated test head) helps reduce testing costs.
Multiple technological innovations in test processors and parallel testing (protocol-level testing/memory vector generator/multi-clock domains) and multi-core processors improve efficiency.
Specifications
|
Item |
Specifications |
|
Test Rate |
200MHz, 400Mbps |
|
Digital I/O Channels |
768 pins (up to 1536 pins) |
|
VI Source Channels |
More than 384 channels at most |
|
Parallel Testing Capability |
Up to 768 DUTs |
|
Vector Storage Depth |
Optional maximum 512M |
|
EPA |
± 500ps |
|
Per Pin Resource Architecture |
PPMU, time test unit, dynamic load, free-running clock, protocol-level testing |
|
Digital Board (DCBU, system-level board) |
|
|
Digital Channel Board |
64 channels or 128 channels |
|
Driver (VIL/VIH-2V~+6V) |
Per Pin |
|
Comparator (VOL/VOH -2V~+ 6V) |
Per Pin |
|
High Voltage Pin Driver (-1.5V~+15.5V) |
1 channel per 8 pins (optional: 1 channel per 2 pins) |
|
PPMU (-2V~+ 6V, ± 50 mA) |
Per Pin (FIMV/FVMI) |
|
Programmable Dynamic Load (±24 mA) |
Per Pin |
|
PTMU (Time/Frequency Measurement Unit: 1GHz sampling rate) |
Per Pin |
|
SCAN (maximum 4G depth) |
Up to 32 scan chains |
|
Digital Signal IO |
Up to 8 output and acquisition engines |
|
Protocol-level Testing |
Output 64 bits, input 32 bits |
|
Device Power on Digital Board (DCBU, system-level board) |
|
|
DPS (BUVI Rider, -2~+12V, ±512mA) |
8 channels per board, can be paralleled |
|
BPMU (same specifications as DPS, can be used as DPS) |
8 channels per board |
|
Memory test unit on digital board (DCBU, system-level board) |
|
|
Storage vector generator |
X=24, Y=24, Z=10, D=36 |
|
Converter test option on digital board (DCBU, system-level board) |
|
|
Arbitrary waveform generator |
2 AWG/Board, 20 bits |
|
Digitizer |
2 DIG/Board, 16 bits |
|
Reference voltage |
2 Vref/Board, 0V~+ 6V |
|
High voltage VI board (HDVI12) |
|
|
-40 ~ +60V, maximum 1A |
12 channels per board |
|
High density power board (DPS64) |
|
|
-2 ~ +12V, maximum ± 512mA |
64 channels per board, can be paralleled |
|
Software |
|
|
Windows environment |
Version above Windows 10 |
|
Programming language |
C++ |
|
Test system software |
Self-developed software platform: Visual ATE Mix |
|
Test vector conversion tool |
Supports J750, 3380, S200 etc. |
|
System and dimensions |
|
|
Power consumption |
Maximum 8KW |
|
Test head dimensions |
13 slots, L720*W580*H510 mm |
Software platform - Visual ATE Mix
The newly designed test software platform Visual ATE Mix includes development, maintenance, and mass production environments, and integrates rich development and debugging tools, which can help test engineers efficiently and quickly develop, debug, and release test programs according to test specifications, ultimately shortening the time to market for customer products.
Visual ATE Mix is the universal software platform for all Macrotest IC testers, including SoC testers and analog testers.
IDE
Visual ATE Mix IDE features a modern visual interface, supporting form filling, code, and template programming.
OI
The Visual ATE Mix operation interface provides customers with a process interface for starting production and integrates real-time monitoring and dynamic PAT, which can be used for automotive device testing.
MI
The Visual ATE Mix maintenance interface is used for visual calibration, inspection, and verification. Users can obtain system and device information from the MI interface.
Tools
Visual ATE Mix provides various debugging tools to accelerate program development and import time.
Feature testing tools
Keywords
MS8000
MS8000
Contact Us
Classification
Contact Us
Nanjing Hongtai Semiconductor Technology Co., Ltd. (Group Headquarters)
Phone Number:+86-25-69067857
Floor 15 and 16, Block A, IC Design Building, No. 99 Jinsui Road, Pukou District, Nanjing City, Jiangsu Province
Shanghai Hongtai Core Semiconductor Technology Co., Ltd. (Shanghai Subsidiary)
Phone Number:+86-21-53082067
Address: Floor 6, Building 3, East District, 2169 Chen Hang Highway, Minhang District, Shanghai
Shenzhen Nuotai Core Equipment Co., Ltd. (Shenzhen Subsidiary)
Phone Number:+86-18123860446
Address: Floor 1 and Floor 4, Building D, Wanfeng Huafeng High-tech Industrial Park, Shajing Street, Bao 'an District, Shenzhen
Azur Test Co., Ltd. (Nippon Child)
Phone Number:+81-49-211-5033
Site: 2-8-15 Kasumigaseki East, Kawagoe-shi, Saitama Plaza S Kasumigaseki 1F
Nanjing Hengtai Core Technology Co., Ltd. (Nanjing Subsidiary)
Phone Number:+86-25-58915619
Address: Floor 17, Block A, IC Design Building, No. 99 Jinsui Road, Pukou District, Nanjing
Su Gong Wang An Bei No. 32011102010656